From ac1a257eb74395f949a1a9693cbb3a1e16e69717 Mon Sep 17 00:00:00 2001
From: mrDarker <mr.darker@163.com>
Date: 星期五, 15 八月 2025 11:44:52 +0800
Subject: [PATCH] 1. 优化SIdeDimensionSetting表格的读取 2. 优化侧面检的功能，从固定的36个检测点变更为自己设置

---
 EdgeInspector_App/Recipe/GlassRecipe.h |   11 ++++++-----
 1 files changed, 6 insertions(+), 5 deletions(-)

diff --git a/EdgeInspector_App/Recipe/GlassRecipe.h b/EdgeInspector_App/Recipe/GlassRecipe.h
index b1de367..ef63bc4 100644
--- a/EdgeInspector_App/Recipe/GlassRecipe.h
+++ b/EdgeInspector_App/Recipe/GlassRecipe.h
@@ -332,12 +332,13 @@
 	int  m_nTopOffset = 0;			// Inspect Top Offset
 	int  m_nRectRight = 0;			// Inspect Rect R
 	int  m_nBottomOffset = 0;       // Inspect Bottom Offset
+
 	// RIP chip detection
-	BOOL	m_bRipUseInspect = FALSE;
-	int		m_nRipInspect_Range_um=0;
-	int		m_nRipInspect_SideLine_Offset_um=0;
-	int		m_nRipMin_Threshold = 0;
-	int		m_nRipMax_Threshold = 0;
+	BOOL m_bRipUseInspect = FALSE;
+	int	 m_nRipInspect_Range_um=0;
+	int	 m_nRipInspect_SideLine_Offset_um=0;
+	int	 m_nRipMin_Threshold = 0;
+	int	 m_nRipMax_Threshold = 0;
 	
 	
 	// Judgement

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