From 9c01db3682d24d8219029d1fbcc5adaef1ce8b4e Mon Sep 17 00:00:00 2001
From: mrDarker <mr.darker@163.com>
Date: 星期四, 10 七月 2025 17:25:53 +0800
Subject: [PATCH] 优化：修正 Notch 缺陷检测中 mask 膨胀次数与 offset 无限制问题，优化代码稳健性 - 限制 Offset 最大值为 50，防止因过大导致耗时过长或内存异常； - 限制 Dilate 膨胀次数不超过 50，避免异常耗时，超出时记录日志警告； - 修复内存释放遗漏，补充释放 pDilatedMaskImage，防止内存泄漏；

---
 EdgeInspector_App/Defect.h |    4 ++++
 1 files changed, 4 insertions(+), 0 deletions(-)

diff --git a/EdgeInspector_App/Defect.h b/EdgeInspector_App/Defect.h
index 7e2a743..026e37a 100644
--- a/EdgeInspector_App/Defect.h
+++ b/EdgeInspector_App/Defect.h
@@ -148,6 +148,8 @@
 
 		m_dSizeX_um = 0.0;
 		m_dSizeY_um = 0.0;
+		m_dChamfer_um = 0.0;
+		m_dChamferOff_um = 0.0;
 
 		m_nDefectMergeCount = 0;
 		m_bDefectMergeRemoved = FALSE;
@@ -174,6 +176,8 @@
 
 	double			m_dSizeX_um;
 	double			m_dSizeY_um;
+	double			m_dChamfer_um;
+	double			m_dChamferOff_um;
 
 	// Merge
 	int				m_nDefectMergeCount;

--
Gitblit v1.9.3