From 9c01db3682d24d8219029d1fbcc5adaef1ce8b4e Mon Sep 17 00:00:00 2001
From: mrDarker <mr.darker@163.com>
Date: 星期四, 10 七月 2025 17:25:53 +0800
Subject: [PATCH] 优化：修正 Notch 缺陷检测中 mask 膨胀次数与 offset 无限制问题，优化代码稳健性 - 限制 Offset 最大值为 50，防止因过大导致耗时过长或内存异常； - 限制 Dilate 膨胀次数不超过 50，避免异常耗时，超出时记录日志警告； - 修复内存释放遗漏，补充释放 pDilatedMaskImage，防止内存泄漏；

---
 EdgeInspector_App/Data/DefectStorage.cpp |    2 ++
 1 files changed, 2 insertions(+), 0 deletions(-)

diff --git a/EdgeInspector_App/Data/DefectStorage.cpp b/EdgeInspector_App/Data/DefectStorage.cpp
index 65fa59d..6656b1a 100644
--- a/EdgeInspector_App/Data/DefectStorage.cpp
+++ b/EdgeInspector_App/Data/DefectStorage.cpp
@@ -309,6 +309,8 @@
 	pDefect->m_bJudge_NG = TRUE;
 	pDefect->m_dSizeX_um = dMeasureResult_um;
 	pDefect->m_dSizeY_um = dMeasureDiff_um;
+	pDefect->m_dChamfer_um = dMeasureResult_um;
+	pDefect->m_dChamferOff_um = dMeasureDiff_um;
 	pDefect->m_DefectInfo = defect;
 
 	if(m_pGrabber->GetSmallImage(iScan,pDefect->m_Image

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